利用顯微鏡上的暗場功能在 SMS 上執行奈米光譜分析。透過在暗場模式下測量光散射光譜來表徵奈米材料。
| Spectrometer and Detectors | ||||
|---|---|---|---|---|
| Spectrometers | MicroHR | iHR320 | iHR550 | |
| Excitation Sources | Xenon Lamp (200 nm – 2200 nm) | |||
| Tungsten Halogen Lamp ( > 350 nm) | ||||
| Supercontinuum Laser ( > 400 nm) | ||||
| Spectral Range (nm)1 | 250 nm – 2200 nm | |||
| Recommended Gratings2 | 1200 g/mm, 600 g/mm, 15 0 g/mm | |||
| Spectral Resolution3 (nm) | 0.39 | 0.18 | 0.1 | |
| Microscope | |||||
|---|---|---|---|---|---|
| Microscope Objectives4 | Magnification | 10X | 50X | 100X | |
| Spot Size (fiber-coupled) | < 50 μm | < 12 μm | < 6 μm | ||
| Spot Size (free space-coupled) | < 10 μm | < 5 μm | < 2 μm | ||
| Sample Stage | XYZ (Manual and motorized options available) – 75 x 50 mm; 100 x 100 mm; 150 x 150 mm; 300 x 300 mm | ||||
| Vision Camera | Software controlled vision camera included | ||||
1 Extension into mid-IR available on request
2 Other gratings available on request
3 Based on 1200 g/mm grating at 500nm and a 26 μm pixel CCD
4 Other objectives available on request
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