This application note reports on true colocalized AFM-Raman measurements of exfoliated graphene flakes on SiO2/Si. Topographic, contact potential difference, and Raman data are obtained on same location with the same tip using a fully integrated AFM-Raman microscope, the new SignatureSPM.
Scanning Probe Microscope with Chemical Signature
Real-time and Direct Correlative Nanoscopy
AFM-Raman for physical and chemical imaging
AFM-Raman for Physical and Chemical imaging
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