This application note reports on colocalized AFM-Raman measurements of vertical Van der Waals heterostructures of 2D materials: hBN/graphene/WSe2 and graphite gate/hBN/bilayer graphene/hBN. Topographic, contact potential difference, and Raman data are generated on same location with the same tip using a fully integrated AFM-Raman microscope, the new SignatureSPM.
Scanning Probe Microscope with Chemical Signature
Real-time and Direct Correlative Nanoscopy
AFM-Raman for physical and chemical imaging
AFM-Raman for Physical and Chemical imaging
The AFM optical platform
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